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Phase formation in ALD Hf1–xTixO2 and Zr1–xTixO2 films from amorphous to crystalline solid solutions Full article

Journal Bulletin of Materials Science
ISSN: 0973-7669 , E-ISSN: 0250-4707
Output data Year: 2026, Volume: 49, Article number : 173, Pages count : 14 DOI: 10.1007/s12034-026-03653-0
Tags Atomic layer deposition; mixed oxides; phase formation; solid solution.
Authors KHIZHNYAK EUGENE A 1 , SHAYAPOV VLADIMIR R 1 , FEDORENKO ANASTASIYA D 1 , KOROLKOV ILYA V 1 , GORYAINOV SERGEI V 2 , MAXIMOVSKIY EUGENE A 1 , LEBEDEV MIKHAIL S 1
Affiliations
1 Nikolaev Institute of Inorganic Chemistry SB RAS
2 Sobolev Institute of Geology and Mineralogy SB RAS

Funding (1)

1
Cite: KHIZHNYAK E.A. , SHAYAPOV V.R. , FEDORENKO A.D. , KOROLKOV I.V. , GORYAINOV S.V. , MAXIMOVSKIY E.A. , LEBEDEV M.S.
Phase formation in ALD Hf1–xTixO2 and Zr1–xTixO2 films from amorphous to crystalline solid solutions
Bulletin of Materials Science. 2026. V.49. 173 :1-14. DOI: 10.1007/s12034-026-03653-0 WOS Scopus
Dates:
Submitted: Nov 7, 2025
Accepted: Feb 11, 2026
Published print: Aug 17, 2026
Published online: Aug 17, 2026
Identifiers:
≡ Web of science: WOS:001851245800001
≡ Scopus: 2-s2.0-105047544966
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