A Thin Layer Method for the LA-ICP-MS Analysis of Trace Element Concentrates Full article

Journal	Journal of Analytical Chemistry ISSN: 1608-3199 , E-ISSN: 1061-9348
Output data	Year: 2023, Volume: 78, Number: 3, Pages: 316-323 Pages count : 8 DOI: 10.1134/s1061934823030097
Authors	Medvedev N.S. 1 , Kurbatova V.D. 1,2 , Saprykin A.I. 1,2
Affiliations	1 Nikolaev Institute of Inorganic Chemistry, Siberian Branch, Russian Academy of Sciences, Novosibirsk, Russia 2 Novosibirsk National State Research University, Novosibirsk, Russia

Funding (1)

1

Ministry of Science and Higher Education of the Russian Federation

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