Accounting the Eccentricity of a Polycrystalline Sample in the Debye–Scherrer Scheme. Certification of a New Y2O3 XRD Standards Full article
| Journal |
Journal of Structural Chemistry
ISSN: 1573-8779 , E-ISSN: 0022-4766 |
||||
|---|---|---|---|---|---|
| Output data | Year: 2025, Volume: 66, Number: 10, Pages: 2225-2238 Pages count : 14 DOI: 10.1134/S0022476625100208 | ||||
| Tags | XRD, area detector, calibration, small crystals, unit cell parameters, accuracy, reference, eccentricity | ||||
| Authors |
|
||||
| Affiliations |
|
Abstract:
Issues related to the procedure of optimizing the calibration of modern area-detector diffractometers using
reference single crystals are considered. It is shown that the accuracy of measuring the unit cell parameters
(UCPs) of polycrystalline samples in the Debye–Scherrer scheme can be improved by considering the
eccentricity. The procedure is tested on a CeO2 polycrystalline sample (SRM674b). The value obtained for
the cubic unit cell parameter a = 5.4117(2) Å differs from the reference one by 0.0002 Å, in agreement with
the experiment's absolute error. The XRD certification of a promising Y2O3 XRD standard is performed
(TU 48-4-524-90; ItO-V grade; 99.999% purity; cubic unit cell parameter a is 10.6047(3) Å).
Cite:
Ivanova Y.A.
, Kudryavtsev A.L.
, Serebrennikova P.S.
, Gromilov S.A.
Accounting the Eccentricity of a Polycrystalline Sample in the Debye–Scherrer Scheme. Certification of a New Y2O3 XRD Standards
Journal of Structural Chemistry. 2025. V.66. N10. P.2225-2238. DOI: 10.1134/S0022476625100208
Accounting the Eccentricity of a Polycrystalline Sample in the Debye–Scherrer Scheme. Certification of a New Y2O3 XRD Standards
Journal of Structural Chemistry. 2025. V.66. N10. P.2225-2238. DOI: 10.1134/S0022476625100208
Original:
Иванова Ю.А.
, Кудрявцев А.Л.
, Серебренникова П.С.
, Громилов С.А.
Учет эксцентриситета поликристаллического образца при съемке в схеме Дебая-Шеррера. Аттестация нового рентгенографического эталона Y2O3
Журнал структурной химии. 2025. Т.66. №10. 154688 :1-13. DOI: 10.26902/JSC_id154688
Учет эксцентриситета поликристаллического образца при съемке в схеме Дебая-Шеррера. Аттестация нового рентгенографического эталона Y2O3
Журнал структурной химии. 2025. Т.66. №10. 154688 :1-13. DOI: 10.26902/JSC_id154688
Dates:
| Submitted: | Aug 4, 2025 |
| Accepted: | Aug 28, 2025 |
| Published online: | Aug 28, 2025 |
| Published print: | Nov 8, 2025 |
Identifiers:
No identifiers
Citing:
Пока нет цитирований