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Low temperature atomic layer deposition of boron nitride using the in-situ decomposition of ammonium carbamate Full article

Journal Chemical Communications
ISSN: 1359-7345 , E-ISSN: 1364-548X
Output data Year: 2025, Volume: 61, Number: 63, Pages: 11774-11777 Pages count : 4 DOI: 10.1039/d5cc02613j
Authors Álvarez-Yenes Ana 1,2 , Koroteev Victor O 1 , Ryzhikov Maxim R 3 , Ilyn Maxim 4 , Kozlova Svetlana G 3 , Knez Mato 1,5
Affiliations
1 CIC nanoGUNE BRTA, 20018 Donostia-San Sebastián, Basque Country, Spain. an.alvarez@nanogune.eu.
2 University of the Basque Country UPV/EHU, 20018 Donostia-San Sebastián, Basque Country, Spain.
3 Nikolaev Institute of Inorganic Chemistry, Siberian Branch of Russian Academy of Science, 630090 Novosibirsk, Russian Federation.
4 Centro de Física de Materiales CSIC-UPV/EHU, 20018 Donostia-San Sebastián, Basque Country, Spain.
5 IKERBASQUE, Basque Foundation for Science, 48011 Bilbao, Basque Country, Spain.

Abstract: Here, we report on a new atomic layer deposition (ALD) process for the growth of amorphous boron nitride thin films at low temperatures (100–275 °C) using carbamic acid, a highly reactive intermediate species found in the decomposition of ammonium carbamate, as the nitrogen source.
Cite: Álvarez-Yenes A. , Koroteev V.O. , Ryzhikov M.R. , Ilyn M. , Kozlova S.G. , Knez M.
Low temperature atomic layer deposition of boron nitride using the in-situ decomposition of ammonium carbamate
Chemical Communications. 2025. V.61. N63. P.11774-11777. DOI: 10.1039/d5cc02613j WOS OpenAlex
Dates:
Submitted: May 8, 2025
Accepted: Jun 26, 2025
Published online: Jun 27, 2025
Published print: Aug 14, 2025
Identifiers:
Web of science: WOS:001522481800001
OpenAlex: W4411740104
Citing: Пока нет цитирований
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