Thin Layer Method For LA-ICP-MS Analysis Of Trace Elements Concentrates Of Germanium Dioxide Full article

Journal	Atomic Spectroscopy ISSN: 0195-5373
Output data	Year: 2024, Volume: 45, Number: 01, Pages: 26-32 Pages count : 7 DOI: 10.46770/as.2023.256
Authors	Medvedev Nickolay S. 1 , Kurbatova Valeriya D. 1,2 , Guselnikova Tatiana Ya. 1 , Saprykin Anatoly I. 1,2
Affiliations	1 Nikolaev Institute of Inorganic Chemistry, Siberian Branch of Russian Academy of Sciences (NIIC SB RAS), 3, Acad. Lavrentiev Ave., Novosibirsk, 630090, Russia 2 Novosibirsk National Research State University, 2, Pirogova St, Novosibirsk 630090, Russia