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Thin Layer Method For LA-ICP-MS Analysis Of Trace Elements Concentrates Of Germanium Dioxide Full article

Journal Atomic Spectroscopy
ISSN: 0195-5373
Output data Year: 2024, Volume: 45, Number: 01, Pages: 26-32 Pages count : 7 DOI: 10.46770/as.2023.256
Authors Medvedev Nickolay S. 1 , Kurbatova Valeriya D. 1,2 , Guselnikova Tatiana Ya. 1 , Saprykin Anatoly I. 1,2
Affiliations
1 Nikolaev Institute of Inorganic Chemistry, Siberian Branch of Russian Academy of Sciences (NIIC SB RAS), 3, Acad. Lavrentiev Ave., Novosibirsk, 630090, Russia
2 Novosibirsk National Research State University, 2, Pirogova St, Novosibirsk 630090, Russia
Cite: Medvedev N.S. , Kurbatova V.D. , Guselnikova T.Y. , Saprykin A.I.
Thin Layer Method For LA-ICP-MS Analysis Of Trace Elements Concentrates Of Germanium Dioxide
Atomic Spectroscopy. 2024. V.45. N01. P.26-32. DOI: 10.46770/as.2023.256 WOS Scopus РИНЦ OpenAlex
Dates:
Submitted: Dec 15, 2023
Published online: Feb 20, 2024
Identifiers:
Web of science: WOS:001186007300003
Scopus: 2-s2.0-85188453782
Elibrary: 66434659
OpenAlex: W4392372252
Citing:
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OpenAlex 4
Web of science 4
Scopus 1
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