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21
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Ashchepkov I.
, Medvedev N.
, Ivanov A.
, Vladykin N.
, Ntaflos T.
, Downes H.
, Saprykin A.
, Tolstov A.
, Vavilov M.
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Deep mantle roots of the Zarnitsa kimberlite pipe, Siberian craton, Russia: Evidence for multistage polybaric interaction with mantle melts
Journal of Asian Earth Sciences. 2021.
V.213. 104756
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22
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Kuptsov A.V.
, Medvedev N.S.
, Lundovskaya O.V.
, Saprykin A.I.
, Labusov V.A.
Direct analysis of tellurium solid samples with a two-jet arc plasma using electrothermal vaporization
Journal of Analytical Atomic Spectrometry. 2021.
V.36. N12. P.2669-2674. DOI: 10.1039/d1ja00286d
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23
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Gusel’nikova T.Y.
, Tsygankova A.R.
, Saprykin A.I.
Analysis of High-Purity Germanium Dioxide by Inductively Coupled Plasma Atomic Emission Spectrometry with Reaction Distillation of the Matrix
Journal of Analytical Chemistry. 2020.
V.75. N5. P.582-586. DOI: 10.1134/S1061934820050056
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24
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Kuptsov A.V.
, Volzhenin A.V.
, Labusov V.A.
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STEEL ANALYSIS BY ATOMIC EMISSION SPECTROMETRY USING A TWO-JET ARC PLASMATRON WITH SPARK ABLATION
Journal of Analytical Atomic Spectrometry. 2020.
V.35. N11. P.2600-2605. DOI: 10.1039/d0ja00313a
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25
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Medvedev N.S.
, Volzhenin A.V.
, Saprykin A.I.
DETERMINATION OF TRACE ELEMENTS IN HIGH-PURITY TUNGSTEN BY ELECTROTHERMAL VAPORIZATION INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY
Microchemical Journal. 2020.
V.157. 104970
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26
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Medvedev N.S.
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Multi-elemental Analysis of High-purity Molybdenum by Electrothermal Vaporization-Inductively Coupled Plasma Mass Spectrometry
Atomic Spectroscopy. 2020.
V.42. N2. P.71-78. DOI: 10.46770/AS.2020.189
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27
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Гусельникова Т.Я.
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, Сапрыкин А.И.
Атомно-эмиссионный спектральный анализ диоксида германия с предварительным концентрированием примесей
Заводская лаборатория. Диагностика материалов. 2019.
Т.85. №1. С.50-55. DOI: 10.26896/1028-6861-2019-85-1-II-50-55
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28
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Bereznaya S.A.
, Korotchenko Z.V.
, Sarkisov S.Y.
, Korolkov I.V.
, Kuchumov B.M.
, Saprykin A.I.
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Synthesis and characterization of polycrystalline CdSiP2
Materials research express. 2018.
V.5. N5. 056204
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29
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Sysoev V.I.
, Troitsky D.Y.
, Saprykin A.I.
Analysis of silicon carbonitride films by laser mass spectrometry
Journal of Analytical Chemistry. 2013.
V.68. N14. P.1212-1216. DOI: 10.1134/s1061934813140128
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