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X-ray photoelectron study of electrical double layer at graphene/phosphoric acid interface Научная публикация

Журнал Applied Surface Science
ISSN: 1873-5584 , E-ISSN: 0169-4332
Вых. Данные Год: 2020, Том: 515, Номер статьи : 146007, Страниц : 7 DOI: 10.1016/j.apsusc.2020.146007
Ключевые слова Graphene; Fluorinated graphene; Phosphoric acid; Electrical double layer; X-ray photoelectron spectroscopy
Авторы Sysoev Vitalii I. 1,2 , Okotrub Alexander V. 1,2 , Arkhipov Vyacheslav E. 1 , Smirnov Dmitry A. 3 , Bulusheva Lyubov G. 1,2
Организации
1 Nikolaev Institute of Inorganic Chemistry, SB RAS, 3 Acad. Lavrentiev Ave, 630090 Novosibirsk, Russia
2 Novosibirsk State University, 2 Pirogova Str., 630090 Novosibirsk, Russia
3 Institute of Solid State and Material Physics, Dresden University of Technology, 01062 Dresden, Germany

Реферат: Here, we use in situ X-ray photoelectron spectroscopy (XPS) to investigate electrochemical processes at the graphene surface. As a model system, we design a sandwich-type electrochemical cell consisting of working graphene electrode separated from back by a fluorinated graphene (FG) film impregnated with a phosphoric acid electrolyte. Migration of the ions to the graphene electrode under applied potential causes a change of the observed concentration of carbon and phosphorus in the electrochemical cell as compared to the non-charged state. This fact allows revealing the process of electrical double layer formation at the graphene/FG-separator interface. The observed changes in the binding energies of elements composing electrolyte and graphene electrode are related with a shift of the Fermi level due to the charge transfer from the adsorbed ions.
Библиографическая ссылка: Sysoev V.I. , Okotrub A.V. , Arkhipov V.E. , Smirnov D.A. , Bulusheva L.G.
X-ray photoelectron study of electrical double layer at graphene/phosphoric acid interface
Applied Surface Science. 2020. V.515. 146007 :1-7. DOI: 10.1016/j.apsusc.2020.146007 WOS Scopus РИНЦ OpenAlex
Идентификаторы БД:
Web of science: WOS:000525637300108
Scopus: 2-s2.0-85081697987
РИНЦ: 43251643
OpenAlex: W3009685230
Цитирование в БД:
БД Цитирований
Web of science 3
Scopus 5
РИНЦ 2
OpenAlex 5
Альметрики: