DETERMINATION OF TRACE ELEMENTS IN HIGH-PURITY TUNGSTEN BY ELECTROTHERMAL VAPORIZATION INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY

DETERMINATION OF TRACE ELEMENTS IN HIGH-PURITY TUNGSTEN BY ELECTROTHERMAL VAPORIZATION INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY Научная публикация

Журнал

Microchemical Journal
ISSN: 1095-9149 , E-ISSN: 0026-265X

Вых. Данные

Год: 2020, Том: 157, Номер статьи : 104970, Страниц : 9 DOI: 10.1016/j.microc.2020.104970

Авторы

Medvedev Nicolay S. ¹ , Volzhenin Artyom V. ¹ , Saprykin Anatoly I. ¹

Организации

1	Nikolaev Institute of Inorganic Chemistry, Siberian Branch of Russian Academy of Sciences (NIIC SB RAS), 3, Acad. Lavrentiev Ave., Novosibirsk, Russia

Medvedev N.S. , Volzhenin A.V. , Saprykin A.I.
DETERMINATION OF TRACE ELEMENTS IN HIGH-PURITY TUNGSTEN BY ELECTROTHERMAL VAPORIZATION INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY
Microchemical Journal. 2020. V.157. 104970 :1-9. DOI: 10.1016/j.microc.2020.104970 WOS OpenAlex

Web of science:	WOS:000566869100008
OpenAlex:	W3027081332

БД	Цитирований
Web of science	7
OpenAlex	10